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Graduate Student Activities
The TTTC Student Activities Committee is organizing two activities aiming to provide graduate students with an opportunity to disseminate their research and obtain visibility in the international test community. More...

TTEP
TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics are also offered.

VTS - May 1st - May 5th, 2011
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems.
The VTS Program Committee invites original, unpublished paper submissions for VTS 2011. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.


PROGRAM CHAIR

Claude Thibeault
École de Technologie supérieure
claude.thibeault@etsmtl.ca

GENERAL CHAIR

Cecilia Metra
DEIS University of Bologna
cecilia.metra@unibo.it
NEWS
Tutorials: the two tutorials are canceled
Presentation Information: final presentation submission deadline is April 24th, 2011. Click here for more details.
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VTS Topics
Major topics include, but are not limited to:
  • Analog, Mixed-Signal & RF Test
  • ATPG & Compression
  • ATE Architecture & Software
  • Board & System Test
  • Built-In Self-Test (BIST)
  • Current Based Test
  • Defect/Fault Tolerance & Self-Repair
  • Delay & Performance Test
  • Design for Testability (DFT)
  • Design Verification/Validation
  • Diagnosis and Debug
  • Embedded System and Microsystems Test
  • Embedded Test Methods
  • Emerging Technologies Test
  • FPGA Test
  • Fault Modeling and Simulation
  • Infrastructure IP
  • Low-Power IC Test
  • MEMS And Sensor Test
  • Memory Test and Repair
  • On-Line Test
  • Power Issues in Test
  • System-on-Chip (SOC) Test
  • System-in-Package Test
  • Standards
  • Test Economics
  • Thermal Test
  • Test of Biomedical Devices
  • Test of High-Speed I/O
  • Test Quality and Reliability
  • Test Resource Partitioning
  • Transients & Soft Errors
  •  
    DEADLINES
  • Presentation: April, 24th
  • Hotel: April, 20th
  • Registration: April, 20th
  • PhD Award: April, 1st
  • Abstract: Sep. 19th '10
  • PDF: Sep. 26th '10
  • Special S.: Oct. 8th '10
  • IP Sessions: Oct. 8th '10
  • Notification: Nov. 28th '10


  • CONTACTS & FEEDBACK

    For any questions you can contact the VTS Office, the General Chair or the Program Chair.

    Moreover, The VTS Organizing Committee is interested in providing a rich historical view of VTS. Please send information you believe to be relevant to the historian.

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