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VTS - April 23rd - 26th, 2012


The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems.
The VTS Program Committee invites original, unpublished paper submissions for VTS 2012. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.


PROGRAM CHAIR

Claude Thibeault
École de Technologie supérieure
claude.thibeault@etsmtl.ca

GENERAL CHAIR

Cecilia Metra
DEIS University of Bologna
cecilia.metra@unibo.it
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VTS Topics
Major topics include, but are not limited to:
  • Analog, Mixed-Signal & RF Test
  • ATPG & Compression
  • ATE Architecture & Software
  • Built-In Self-Test (BIST)
  • Defect & Current Based Test
  • Defect/Fault Tolerance
  • Delay & Performance Test
  • Design for Testability (DFT)
  • Design Verification/Validation
  • Diagnosis & Debug
  • Embedded System & Board Test
  • Embedded Test Methods
  • Emerging Technologies Test
  • FPGA Test
  • Fault Modeling & Simulation
  • Hardware Security
  • Low-Power IC Test
  • Microsystems, MEMS & Sensor Test
  • Memory Test & Repair
  • On-Line Test & Self-Repair
  • Power & Thermal Issues in Test
  • System-on-Chip (SOC) Test
  • System-in-Package & 3D Test
  • Test Standards
  • Test Economics
  • Test of Biomedical Devices
  • Test of High-Speed I/O
  • Test Quality & Reliability
  • Test Resource Partitioning
  • Transients & Soft Errors
  •  
    DEADLINES
  • Registr. cutoff: Apr. 12th
  • Hotel cutoff: Apr. 1st
  • Abstract: Oct. 8th '11
  • PDF: Oct. 21st - extended
  • Special Sess.: Nov. 15th '11
  • IP Sess.: Nov. 15th '11
  • Notification: Jan. 7th '12


  • CONTACTS & FEEDBACK

    For any questions you can contact the VTS Office, the General Chair or the Program Chair.

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