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Graduate Student Activities
The TTTC Student Activities Committee is organizing two activities aiming to provide graduate students with an opportunity to disseminate their research and obtain visibility in the international test community. More...

TTEP
TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics are also offered.

VTS - May 3rd - May 7th, 2009
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems.
The VTS Program Committee invites original, unpublished paper submissions for VTS 2009. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.


Technical Paper Submissions

General Information

PROGRAM CHAIR

Cecilia Metra
ARCES - University of Bologna
Viale Risorgimento 2
40136 Bologna, Italy
T: + 39 051 209 3038
F: + 39 051 209 3073
E: cecilia.metra@unibo.it

GENERAL CHAIR

Magdy Abadir
Freescale Semiconductor
5824 Westslope Dr
Austin TX 78731
T: +1-512-996-4906
F: +1-512-996-7450
E: M.Abadir@freescale.com
Sponsors
Corporate Supporters
Please visit our CORPORATE SUPPORTERS
VTS Topics
Major topics include, but are not limited to:
  • Analog, M-S & RF Test
  • Automatic Test Generation
  • ATE Architecture & SW
  • Board & System Test
  • Built-In Self-Test (BIST)
  • Current Based Test
  • Defect Tolerance
  • Delay & Performance Test
  • Design for Testability (DFT)
  • Design Verification/Validation
  • Diagnosis and Debug
  • Embedded System Test
  • Embedded Test Methods
  • FPGA Test
  • Fault Modeling and Simulation
  • Infrastructure IP
  • Memory Test and Repair
  • Microprocessor Test
  • 3D System Test
  • Nanometer Technologies Test
  • On-Line Test
  • Power Issues in Test
  • Self-Repair & Fault Tolerance
  • Sensor, MEMS, Microsystem Test
  • SOC and SiP Test
  • Standards
  • Test Resource Partitioning
  • Test Economics
  • Thermal Test
  • Test Data Compression
  • Test of Biomedical Devices
  • Test of High-Speed I/O
  • Test Quality and Reliability
  • Yield Analysis & Optimization
  •  
    Sponsorship Opportunities
    Click here to read more about sponsorship opportunities at VTS'09.


    Graduate Student Activities
    Ph.D. students graduating in 2009 are invited to participate to the Doctoral Thesis Award Contest.
    All other graduate students (Ph.D. or M.S.) working on a test-related thesis are invited to participate to the Thesis Research Poster Session.


    Location
    VTS will take place from May 3rd to May 7th, 2009, in Santa Cruz, California, USA More...


    VTS'08 IP Presentations
    Presentations have been collected from VTS'08 IP sessions and are available to VTS'08 attendees. Click here for more information.


    DEADLINES
  • Early Reg.: Apr. 24th, 09
     

  • CONTACTS & FEEDBACK

    For any questions you can contact the VTS Office, the General Chair or the Program Chair.

    Moreover, The VTS Organizing Committee is interested in providing a rich historical view of VTS. Please send information you believe to be relevant to the historian.

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